Search Type: US Publications
NOT aclm/(schottky and diode$) AND aclm/((sic or "silicon carbide") and wafer$) AND spec/(schottky and diode$)

Classification Number Url PMD Assignee Assignee Loc Inventor(s) Inventor Loc(s) Filing Date Issued Date App Contact Info
20040266057 Silicon carbide and method of manufacturing the same 20040266057HOYA CORPORATIONN/ANagasawa, HiroyukiTokyo, JPJuly 14, 2004December 30, 2004SUGHRUE, MION, ZINN, MACPEAK & SEAS, PLLC; 2100 Pennsylvania Avenue, N.W.; Washington; DC; 20037-3213; US;
20040206976 Manufacturing methods for large area silicon carbide devices 20040206976N/AN/AAgarwal, Anant:; Ryu, Sei-Hyung:; Palmour, John W.Chapel Hill, NC:Cary, NC:Raleigh, NCMay 14, 2004October 21, 2004MYERS BIGEL SIBLEY & SAJOVEC; PO BOX 37428; RALEIGH; NC; 27627; US;
20040187766 Method of fabricating monocrystalline crystals 20040187766N/AN/ALetertre, FabriceGrenoble, FRNovember 20, 2003September 30, 2004WINSTON & STRAWN; PATENT DEPARTMENT; 1400 L STREET, N.W.; WASHINGTON; DC; 20005-3502; US;
20030070611 SiC single crystal, method for manufacturing SiC single crystal, SiC water having an epitaxial film, method for manufacturing SiC wafer having an epitaxial film, and SiC electronic device 20030070611N/AN/ANakamura, Daisuke:; Ito, Tadashi:; Kondo, Hiroyuki:; Naito, MasamiNagoya-city, JP:Nishikamo-gun, JP:Kariya-city, JP:Inazawa-city, JPOctober 10, 2002April 17, 2003LAW OFFICES OF DAVID G. POSZ; 2000 L STREET, N.W.; SUITE 200; WASHINGTON; DC; 20036; US;
20030047748 Large area silicon carbide devices 20030047748N/AN/AAgarwal, Anant:; Ryu, Sei-Hyung:; Palmour, John W.Chapel Hill, NC:Cary, NC:Raleigh, NCSeptember 12, 2001March 13, 2003MYERS BIGEL SIBLEY & SAJOVEC; PO BOX 37428; RALEIGH; NC; 27627; US;
20020096106 Electronic device with composite substrate 20020096106N/AN/AKub, Francis J.:; Hobart, Karl D.Arnold, MD:Upper Marlboro, MDJanuary 19, 2001July 25, 2002NAVAL RESEARCH LABORATORY; ASSOCIATE COUNSEL (PATENTS); CODE 1008.2; 4555 OVERLOOK AVENUE, S.W.; WASHINGTON; DC; 20375-5320; US;
20020086534 M'''N based materials and methods and apparatus for producing same 20020086534N/AN/ACuomo, Jerome J.:; Williams, N. Mark:; Hanser, Andrew David:; Carlson, Eric Porter:; Thomas, Darin TazeCary, NC:Raleigh, NC:Raleigh, NC:Raleigh, NC:Raleigh, NCNovember 30, 2001July 4, 2002JENKINS & WILSON, PA; 3100 TOWER BLVD; SUITE 1400; DURHAM; NC; 27707; US;
20020078881 Method and apparatus for producing M'''N columns and M'''N materials grown thereon 20020078881N/AN/ACuomo, Jerome J.:; Williams, N. Mark:; Hanser, Andrew David:; Carlson, Eric Porter:; Thomas, Darin TazeCary, NC:Raleigh, NC:Raleigh, NC:Raleigh, NC:Raleigh, NCNovember 30, 2001June 27, 2002JENKINS & WILSON, PA; 3100 TOWER BLVD; SUITE 1400; DURHAM; NC; 27707; US;
20020019117 Silicon carbide and method of manufacturing the same 20020019117HOYA CORPORATIONN/ANagasawa, HiroyukiTokyo, JPAugust 9, 2001February 14, 2002SUGHRUE, MION, ZINN, MACPEAK & SEAS, PLLC; 2100 Pennsylvania Avenue, N.W.; Washington; DC; 20037-3213; US;
20020017647 Junction termination for SiC schottky diode 20020017647N/AN/ABakowski, Mietek:; Gustafsson, Ulf:; Harris, Christopher I.Skultuna, SE:Linkoping, SE:Sollentuna, SEJuly 27, 2001February 14, 2002Connolly Bove Lodge & Hutz LLP; Suite 800; 1990 M Street, N.W.; Washington; DC; 20036-3425; US;