Search Type: US Issued Patents

aclm/semiconduct$ AND aclm/("carrier lifetime" or casting) NOT aclm/electric$ AND aclm/frequency

Classification	Number	Url	PMD	Priority	Assignee	Assignee Loc	Inventor(s)	Inventor Loc(s)	Filing Date	Issued Date
	6,242,106	Fine wire made of a gold alloy, method for its production, and its use	6,242,106	No	W. C. Hereaeus GmbH & Co. KG	Hanau, DE	Herklotz; Gunter:Schrapler; Lutz:Simons; Christoph:Reuel; Jurgen:Cho; Y. C.	Bruchkobel, DE:Karlstein, DE:Biebergemund, DE:Gelnhausen, DE:Inchon, KR	May 5, 1999	June 5, 2001
	5,867,034	Non-destructive method and apparatus for monitoring carrier lifetime of a semiconductor sample during fabrication	5,867,034	No	n/a	n/a	Sokolov; Vladimir:Engelhardt; David C.	1354 E. Wood Duck Trail, Shakopee, MN 55379:3840 1st Ave. South, Minneapolis, MN 55409	January 30, 1997	February 2, 1999
	5,847,941	Switching power supply system and process	5,847,941	No	Origin Electric Company, Limited	Tokyo, JP	Taguchi; Takayuki:Saito; Ryoji	Saitama, JP:Tokyo, JP	April 16, 1997	December 8, 1998
	5,493,395	Wavelength variation measuring apparatus	5,493,395	Yes This application is a continuation of application Ser. No. 08/352,213, filed Dec. 2, 1994, now abandoned, which is a continuation of application Ser. No. 07/877,141, filed May 1, 1992, abandoned.	Canon Kabushiki Kaisha	Tokyo, JP	Otsuka; Masaru	Yokohama, JP	May 8, 1995	February 20, 1996
	5,406,214	Method and apparatus for measuring minority carrier lifetime in semiconductor materials	5,406,214	No	Semilab Felvezeto Fizikai Lab, RT	Budapest, HU	Boda; Janos:Ferenczi; Gyorgy:Horvath; Peter:Mirk; Zoltan:Pavelka; Tibor	Budapest, HU:Budapest, HU:Budapest, HU:Budapest, HU:Budapest, HU	December 16, 1991	April 11, 1995
	5,314,709	Unzippable polymer mask for screening operations	5,314,709	No	International Business Machines Corporation	Armonk, NY	Doany; Fuad E.:Grube; Gary W.:Saraf; Ravi	Katonah, NY:Washingtonville, NY:Briarcliff Manor, NY	March 20, 1991	May 24, 1994
	5,205,091	Modular-accessible-units and method of making same	5,205,091	Yes This is a continuation-in-part of Ser. No. 436,158, filed Nov. 13, 1989, now abandoned, which is a continuation of Ser. No. 106,204, filed Oct. 5, 1987, now abandoned, which is a continuation-in-part of Ser. No. 783,309 , filed Oct. 2, 1985, issued Oct. 6, 1987, as U.S. Pat. No. 4,698,249, which is a continuation of Ser. No. 391,760, filed Jun. 24, 1982, issued Oct. 8, 1985, as U.S. Pat. No. 4,546,024, which is a continuation of Ser. No. 131,516, filed Mar. 18, 1980, now abandoned, and refiled Jan. 3, 1984, as a file wrapper continuation Ser. No. 567,151, issued Jul. 21, 1987 as U.S. Pat. No. 4,681,786.	n/a	n/a	Brown; John G.	20205 State Line Rd., Harvard, IL 60033	July 25, 1991	April 27, 1993
	5,049,816	Semiconductor substrate minority carrier lifetime measurements	5,049,816	No	Texas Instruments Incorporated	Dallas, TX	Moslehi; Mehrdad M.	Dallas, TX	May 31, 1990	September 17, 1991
	4,581,578	Apparatus for measuring carrier lifetimes of a semiconductor wafer	4,581,578	No	Hitachi, Ltd.	Tokyo, JP	Honma; Noriaki:Munakata; Chusuke	Nishitama, JP:Nishitama, JP	January 31, 1984	April 8, 1986
	4,578,641	System for measuring carrier lifetime of semiconductor wafers	4,578,641	No	Exxon Research and Engineering Co.	Florham Park, NJ	Tiedje; J. Thomas	Garwood, NJ	September 24, 1982	March 25, 1986
	4,564,807	Method of judging carrier lifetime in semiconductor devices	4,564,807	No	GA Technologies Inc.	San Diego, CA	Ikezi; Hiroyuki:Freeman; Richard L.	San Diego, CA:Del Mar, CA	March 27, 1984	January 14, 1986
	4,365,208	Gain-controlled amplifier using a controllable alternating-current resistance	4,365,208	No	RCA Corporation	New York, NY	Harford; Jack R.	Flemington, NJ	April 23, 1980	December 21, 1982
	RE30,800	Solid-state video camera	RE30,800	No	Sony Corporation	Tokyo, JP	Yamanaka; Seisuke	Mitaka, JP	January 16, 1980	November 17, 1981
	4,286,215	Method and apparatus for the contactless monitoring carrier lifetime in semiconductor materials	4,286,215	No	Bell Telephone Laboratories, Incorporated	Murray Hill, NJ	Miller; Gabriel L.	Westfield, NJ	May 18, 1979	August 25, 1981
	4,090,132	Measurement of excess carrier lifetime in semiconductor devices	4,090,132	No	Solid State Measurements, Inc.	Monroeville, PA	Alexander; William J.	Verona, PA	March 10, 1976	May 16, 1978
	4,069,501	Solid-state video camera	4,069,501	No	Sony Corporation	Tokyo, JA	Yamanaka; Seisuke	Mitaka, JA	May 11, 1976	January 17, 1978
	3,943,549	Thyristor	3,943,549	Yes This is a continuation of application Ser. No. 336,555 filed Feb. 28, 1973, now abandoned.	BBC Brown, Boveri & Company, Limited	Baden, CH	Jaecklin; Andre A.:Cornu; Josef:Lietz; Manfred	Ennetbaden, CH:Staretschwil, CH:Wurenlos, CH	December 5, 1974	March 9, 1976