Search Type: US Issued Patents
aclm/semiconduct$ AND aclm/("carrier lifetime" or casting) AND aclm/electric$ AND aclm/frequency

Classification Number Url PMD Priority Assignee Assignee Loc Inventor(s) Inventor Loc(s) Filing Date Issued Date
classification-0 6,369,603 Radio frequency coupling apparatus and method for measuring minority carrier lifetimes in semiconductor materials 6,369,603
Yes
Midwest Research InstituteKansas City, MOJohnston; Steven W.:Ahrenkiel; Richard K.Golden, CO:Lakewood, COJuly 14, 2000April 9, 2002
classification-0 6,275,060 Apparatus and method for measuring minority carrier lifetimes in semiconductor materials 6,275,060
Yes
Midwest Research InstituteKansas City, MOAhrenkiel; Richard K.:Johnston; Steven W.Lakewood, CO:Golden, COApril 1, 1999August 14, 2001
classification-0 5,929,652 Apparatus for measuring minority carrier lifetimes in semiconductor materials 5,929,652
No
Midwest Research InstituteKansas City, MOAhrenkiel; Richard K.Lakewood, COSeptember 2, 1997July 27, 1999
classification-0 4,572,812 Method and apparatus for casting conductive and semiconductive materials 4,572,812
No
The United States of America as represented by the Secretary of EnergyWashington, DCCiszek; Theodore F.Evergreen, COAugust 13, 1984February 25, 1986