Search Type: US Issued Patents
aclm/semiconduct$ AND aclm/("carrier lifetime" or casting) AND aclm/electric$ NOT aclm/frequency AND spec/frequency

Classification Number Url PMD Priority Assignee Assignee Loc Inventor(s) Inventor Loc(s) Filing Date Issued Date
6,774,476 Power converter and method for producing the same 6,774,476
No
Robert Bosch GmbHStuttgart, DESpitz; Richard:Goerlach; Alfred:Wallrauch; Alexander:Ruf; Christoph:Urbach; Peter:Knappenberger; UweReutlingen, DE:Kusterdingen, DE:Gomaringen, DE:Eningen, DE:Reutlingen, DE:Muehlacker, DEDecember 4, 2002August 10, 2004
6,759,307 Method to prevent die attach adhesive contamination in stacked chips 6,759,307
No
Micron Technology, Inc.Boise, IDYang; JichengNewark, DENovember 1, 2000July 6, 2004
6,759,010 Use of an array of polymeric sensors of varying thickness for detecting analytes in fluids 6,759,010
Yes
California Institute of TechnologyPasadena, CALewis; Nathan S.:Severin; Erik J.:Freund; Michael:Matzger; Adam J.La Canada, CA:Pasadena, CA:Altadena, CA:Pasadena, CAJuly 20, 2001July 6, 2004
6,732,590 Pressure sensor and process for producing the pressure sensor 6,732,590
No
Infineon Technologies AGMunich, DEGottlieb; Alfred:Schroder; MartinNittendorf, DE:Donaustauf, DENovember 20, 2002May 11, 2004
6,674,159 Bi-level microelectronic device package with an integral window 6,674,159
Yes
Sandia National LaboratoriesAlbuquerque, NMPeterson; Kenneth A.:Watson; Robert D.Albuquerque, NM:Tijeras, NMFebruary 25, 2002January 6, 2004
6,654,153 Semiconductor saturable absorber-based optical domain optical signal sampling device for sampling an optical signal 6,654,153
No
Agilent Technologies, Inc.Palo Alto, CAKaneko; YasuhisaKawasaki, JPNovember 30, 2001November 25, 2003
6,607,932 High modulation frequency light emitting device exhibiting spatial relocation of minority carriers to a non-radiative recombination region 6,607,932
Yes
Yale UniversityNew Haven, CTWoodall; Jerry M.:Koudelka; Robert D.Woodbridge, CT:New Haven, CTAugust 28, 2002August 19, 2003
6,605,830 Power semiconductor device including an IGBT with a MOS transistor as a current suppressing device incorporated therein 6,605,830
Yes
Mitsubishi Denki KaishaTokyo, JPKusunoki; ShigeruTokyo, JPSeptember 20, 2001August 12, 2003
6,538,312 Multilayered microelectronic device package with an integral window 6,538,312
Yes
Sandia CorporationAlbuquerque, NMPeterson; Kenneth A.:Watson; Robert D.Albuquerque, NM:Tijeras, NMFebruary 1, 2002March 25, 2003
6,495,895 Bi-level multilayered microelectronic device package with an integral window 6,495,895
Yes
Sandia CorporationAlbuquerque, NMPeterson; Kenneth A.:Watson; Robert D.Albuquerque, NM:Tijeras, NMFebruary 1, 2002December 17, 2002
6,489,670 Sealed symmetric multilayered microelectronic device package with integral windows 6,489,670
Yes
Sandia CorporationAlbuquerque, NMPeterson; Kenneth A.:Watson; Robert D.Albuquerque, NM:Tijeras, NMFebruary 1, 2002December 3, 2002
6,423,571 Method of making a semiconductor device having a stress relieving mechanism 6,423,571
Yes
Hitachi, Ltd.Tokyo, JPOgino; Masahiko:Nagai; Akira:Eguchi; Shuji:Ishii; Toshiaki:Segawa; Masanori:Akahoshi; Haruo:Takahashi; Akio:Miwa; Takao:Tanaka; Naotaka:Anjou; IchirouHitachi, JP:Hitachi, JP:Tokai-mura, JP:Hitachi, JP:Hitachi, JP:Hitachi, JP:Hitachiohta, JP:Hitachinaka, JP:Chiyoda-machi, JP:Koganei, JPJune 20, 2001July 23, 2002
6,323,509 Power semiconductor device including a free wheeling diode and method of manufacturing for same 6,323,509
No
Mitsubishi Denki Kabushiki KaishaTokyo, JPKusunoki; ShigeruTokyo, JPJune 17, 1999November 27, 2001
6,294,401 Nanoparticle-based electrical, chemical, and mechanical structures and methods of making same 6,294,401
Yes
Massachusetts Institute of TechnologyCambridge, MAJacobson; Joseph M.:Hubert; Brian N.:Ridley; Brent:Nivi; Babak:Fuller; SawyerNewton, MA:Cambridge, MA:Cambridge, MA:Boston, MA:Los Osos, CAJune 17, 1999September 25, 2001
6,211,961 Optical method for the characterization of the electrical properties of semiconductors and insulating films 6,211,961
Yes
Brown University Research FoundationProvidence, RIMaris; Humphrey JBarrington, RIAugust 30, 1999April 3, 2001
6,008,906 Optical method for the characterization of the electrical properties of semiconductors and insulating films 6,008,906
Yes
Brown University Research FoundationProvidence, RIMaris; Humphrey J.Barrington, RISeptember 5, 1997December 28, 1999
5,773,858 Power diode 5,773,858
No
Eupec Europaeische Gesellschaft fuer Leistungshalbleiter mbH & Co. KG.Warstein-Belecke, DESchlangenotto; Heinrich:Sommer; Karl-Heinz:Kaussen; FranzNeu-Isenburg, DE:Warstein, DE:Warstein, DEJanuary 19, 1993June 30, 1998
5,528,058 IGBT device with platinum lifetime control and reduced gaw 5,528,058
Yes
Advanced Power Technology, Inc.Bend, ORPike, Jr.; Douglas A.:Tsang; Dah W.:Katana; James M.:Sdrulla; DumitruBend, OR:Bend, OR:Bend, OR:Bend, OROctober 13, 1994June 18, 1996
5,454,879 Helically grown monolithic high voltage photovoltaic devices and method therefor 5,454,879
No
n/an/aBolger; Stephen R.127 W. 79th St., Apt. 11 J, New York, NY 10024March 17, 1994October 3, 1995
5,399,413 High performance composite and conductive ground plane for electrostatic recording of information 5,399,413
No
Rexham Graphics Inc.South Hadley, MAKatsen; Boris J.:Taylor; Dene H.:Himmelwright; Richard S.:Klausner; Cynthia F.:Sporbert; Edward W.:Stewart; Barbara J.:Cavanaugh; John:Turi; EranLongmeadow, MA:Holyoke, MA:Wilbraham, MA:Hadley, MA:Chicapee, MA:Springfield, MA:Easthampton, MA:Springfield, MAApril 30, 1993March 21, 1995
5,357,357 Liquid crystal display devices with organic thin film formed by compressing molecules on liquid surface and transferring to substrate by horizontal lifting 5,357,357
No
Hitachi, Ltd.Tokyo, JPImazeki; Shuji:Tomioka; Yasushi:Tanaka; Naoki:Taniguchi; Yoshio:Kawakami; Hideaki:Kondo; Katsumi:Yamasaki; MasamiSaitama, JP:Saitama, JP:Saitama, JP:Hino, JP:Chiba, JP:Katsuta, JP:Saitama, JPSeptember 19, 1990October 18, 1994
5,347,526 Wavelength-tunable semiconductor laser 5,347,526
No
Kabushiki Kaisha ToshibaKawasaki, JPSuzuki; Nobuo:Tohyama; Masaki:Onomura; MasaakiTokyo, JP:Tokyo, JP:Tokyo, JPMarch 31, 1993September 13, 1994
5,287,421 All-optical modulation in crystalline organic semiconductor waveguides 5,287,421
No
University of Southern CaliforniaLos Angeles, CAForrest; Stephen R.:Zang; De YuPrinceton, NJ:Irvine, CAJanuary 11, 1993February 15, 1994
5,118,945 Photothermal test process, apparatus for performing the process and heat microscope 5,118,945
No
Siemens AktiengesellschaftMunich, DEWinschuh; Erich:Petry; HaraldNeu-Insenburg, DE:Fechingen, DEApril 24, 1990June 2, 1992
5,075,751 Semiconductor device 5,075,751
Yes
Matsushita Electric Works, Ltd.Osaka, JPTomii; Kazushi:Abe; Toshiroh:Komoda; TakuyaKadoma, JP:Kadoma, JP:Kadoma, JPSeptember 17, 1990December 24, 1991
5,030,853 High speed logic and memory family using ring segment buffer 5,030,853
No
Thunderbird Technologies, Inc.Research Triangle Park, NCVinal; Albert W.Cary, NCMarch 21, 1990July 9, 1991
4,628,203 Non-delineated detector having a differential readout 4,628,203
No
Honeywell, Inc.Minneapolis, MNReine; Marion B.:Kusner; Ronald R.Wellesley, MA:Concord, MAJanuary 14, 1985December 9, 1986
4,485,389 Amorphous semiconductors equivalent to crystalline semiconductors 4,485,389
Yes
Energy Conversion Devices, Inc.Troy, MIOvshinsky; Stanford R.:Izu; MasatsuguBloomfield Hills, MI:Birmingham, MISeptember 29, 1982November 27, 1984
4,259,683 High switching speed P-N junction devices with recombination means centrally located in high resistivity layer 4,259,683
Yes
General Electric CompanySchenectady, NYAdler; Michael S.:Temple; Victor A. K.Schenectady, NY:Clifton Park, NYAugust 21, 1978March 31, 1981
4,217,374 Amorphous semiconductors equivalent to crystalline semiconductors 4,217,374
No
Energy Conversion Devices, Inc.Troy, MIOvshinsky; Stanford R.:Izu; MasatsuguBloomfield Hills, MI:Birmingham, MIMarch 8, 1978August 12, 1980
4,064,521 Semiconductor device having a body of amorphous silicon 4,064,521
Yes
RCA CorporationNew York, NYCarlson; David EmilYardley, PAJuly 30, 1976December 20, 1977