| Classification | Number | Url | PMD | Priority | Assignee | Assignee Loc | Inventor(s) | Inventor Loc(s) | Filing Date | Issued Date |
| 6,774,476 | Power converter and method for producing the same | 6,774,476 | No | Robert Bosch GmbH | Stuttgart, DE | Spitz; Richard:Goerlach; Alfred:Wallrauch; Alexander:Ruf; Christoph:Urbach; Peter:Knappenberger; Uwe | Reutlingen, DE:Kusterdingen, DE:Gomaringen, DE:Eningen, DE:Reutlingen, DE:Muehlacker, DE | December 4, 2002 | August 10, 2004 | |
| 6,759,307 | Method to prevent die attach adhesive contamination in stacked chips | 6,759,307 | No | Micron Technology, Inc. | Boise, ID | Yang; Jicheng | Newark, DE | November 1, 2000 | July 6, 2004 | |
| 6,759,010 | Use of an array of polymeric sensors of varying thickness for detecting analytes in fluids | 6,759,010 | Yes
| California Institute of Technology | Pasadena, CA | Lewis; Nathan S.:Severin; Erik J.:Freund; Michael:Matzger; Adam J. | La Canada, CA:Pasadena, CA:Altadena, CA:Pasadena, CA | July 20, 2001 | July 6, 2004 | |
| 6,732,590 | Pressure sensor and process for producing the pressure sensor | 6,732,590 | No | Infineon Technologies AG | Munich, DE | Gottlieb; Alfred:Schroder; Martin | Nittendorf, DE:Donaustauf, DE | November 20, 2002 | May 11, 2004 | |
| 6,674,159 | Bi-level microelectronic device package with an integral window | 6,674,159 | Yes
| Sandia National Laboratories | Albuquerque, NM | Peterson; Kenneth A.:Watson; Robert D. | Albuquerque, NM:Tijeras, NM | February 25, 2002 | January 6, 2004 | |
| 6,654,153 | Semiconductor saturable absorber-based optical domain optical signal sampling device for sampling an optical signal | 6,654,153 | No | Agilent Technologies, Inc. | Palo Alto, CA | Kaneko; Yasuhisa | Kawasaki, JP | November 30, 2001 | November 25, 2003 | |
| 6,607,932 | High modulation frequency light emitting device exhibiting spatial relocation of minority carriers to a non-radiative recombination region | 6,607,932 | Yes
| Yale University | New Haven, CT | Woodall; Jerry M.:Koudelka; Robert D. | Woodbridge, CT:New Haven, CT | August 28, 2002 | August 19, 2003 | |
| 6,605,830 | Power semiconductor device including an IGBT with a MOS transistor as a current suppressing device incorporated therein | 6,605,830 | Yes
| Mitsubishi Denki Kaisha | Tokyo, JP | Kusunoki; Shigeru | Tokyo, JP | September 20, 2001 | August 12, 2003 | |
| 6,538,312 | Multilayered microelectronic device package with an integral window | 6,538,312 | Yes
| Sandia Corporation | Albuquerque, NM | Peterson; Kenneth A.:Watson; Robert D. | Albuquerque, NM:Tijeras, NM | February 1, 2002 | March 25, 2003 | |
| 6,495,895 | Bi-level multilayered microelectronic device package with an integral window | 6,495,895 | Yes
| Sandia Corporation | Albuquerque, NM | Peterson; Kenneth A.:Watson; Robert D. | Albuquerque, NM:Tijeras, NM | February 1, 2002 | December 17, 2002 | |
| 6,489,670 | Sealed symmetric multilayered microelectronic device package with integral windows | 6,489,670 | Yes
| Sandia Corporation | Albuquerque, NM | Peterson; Kenneth A.:Watson; Robert D. | Albuquerque, NM:Tijeras, NM | February 1, 2002 | December 3, 2002 | |
| 6,423,571 | Method of making a semiconductor device having a stress relieving mechanism | 6,423,571 | Yes
| Hitachi, Ltd. | Tokyo, JP | Ogino; Masahiko:Nagai; Akira:Eguchi; Shuji:Ishii; Toshiaki:Segawa; Masanori:Akahoshi; Haruo:Takahashi; Akio:Miwa; Takao:Tanaka; Naotaka:Anjou; Ichirou | Hitachi, JP:Hitachi, JP:Tokai-mura, JP:Hitachi, JP:Hitachi, JP:Hitachi, JP:Hitachiohta, JP:Hitachinaka, JP:Chiyoda-machi, JP:Koganei, JP | June 20, 2001 | July 23, 2002 | |
| 6,323,509 | Power semiconductor device including a free wheeling diode and method of manufacturing for same | 6,323,509 | No | Mitsubishi Denki Kabushiki Kaisha | Tokyo, JP | Kusunoki; Shigeru | Tokyo, JP | June 17, 1999 | November 27, 2001 | |
| 6,294,401 | Nanoparticle-based electrical, chemical, and mechanical structures and methods of making same | 6,294,401 | Yes
| Massachusetts Institute of Technology | Cambridge, MA | Jacobson; Joseph M.:Hubert; Brian N.:Ridley; Brent:Nivi; Babak:Fuller; Sawyer | Newton, MA:Cambridge, MA:Cambridge, MA:Boston, MA:Los Osos, CA | June 17, 1999 | September 25, 2001 | |
| 6,211,961 | Optical method for the characterization of the electrical properties of semiconductors and insulating films | 6,211,961 | Yes
| Brown University Research Foundation | Providence, RI | Maris; Humphrey J | Barrington, RI | August 30, 1999 | April 3, 2001 | |
| 6,008,906 | Optical method for the characterization of the electrical properties of semiconductors and insulating films | 6,008,906 | Yes
| Brown University Research Foundation | Providence, RI | Maris; Humphrey J. | Barrington, RI | September 5, 1997 | December 28, 1999 | |
| 5,773,858 | Power diode | 5,773,858 | No | Eupec Europaeische Gesellschaft fuer Leistungshalbleiter mbH & Co. KG. | Warstein-Belecke, DE | Schlangenotto; Heinrich:Sommer; Karl-Heinz:Kaussen; Franz | Neu-Isenburg, DE:Warstein, DE:Warstein, DE | January 19, 1993 | June 30, 1998 | |
| 5,528,058 | IGBT device with platinum lifetime control and reduced gaw | 5,528,058 | Yes
| Advanced Power Technology, Inc. | Bend, OR | Pike, Jr.; Douglas A.:Tsang; Dah W.:Katana; James M.:Sdrulla; Dumitru | Bend, OR:Bend, OR:Bend, OR:Bend, OR | October 13, 1994 | June 18, 1996 | |
| 5,454,879 | Helically grown monolithic high voltage photovoltaic devices and method therefor | 5,454,879 | No | n/a | n/a | Bolger; Stephen R. | 127 W. 79th St., Apt. 11 J, New York, NY 10024 | March 17, 1994 | October 3, 1995 | |
| 5,399,413 | High performance composite and conductive ground plane for electrostatic recording of information | 5,399,413 | No | Rexham Graphics Inc. | South Hadley, MA | Katsen; Boris J.:Taylor; Dene H.:Himmelwright; Richard S.:Klausner; Cynthia F.:Sporbert; Edward W.:Stewart; Barbara J.:Cavanaugh; John:Turi; Eran | Longmeadow, MA:Holyoke, MA:Wilbraham, MA:Hadley, MA:Chicapee, MA:Springfield, MA:Easthampton, MA:Springfield, MA | April 30, 1993 | March 21, 1995 | |
| 5,357,357 | Liquid crystal display devices with organic thin film formed by compressing molecules on liquid surface and transferring to substrate by horizontal lifting | 5,357,357 | No | Hitachi, Ltd. | Tokyo, JP | Imazeki; Shuji:Tomioka; Yasushi:Tanaka; Naoki:Taniguchi; Yoshio:Kawakami; Hideaki:Kondo; Katsumi:Yamasaki; Masami | Saitama, JP:Saitama, JP:Saitama, JP:Hino, JP:Chiba, JP:Katsuta, JP:Saitama, JP | September 19, 1990 | October 18, 1994 | |
| 5,347,526 | Wavelength-tunable semiconductor laser | 5,347,526 | No | Kabushiki Kaisha Toshiba | Kawasaki, JP | Suzuki; Nobuo:Tohyama; Masaki:Onomura; Masaaki | Tokyo, JP:Tokyo, JP:Tokyo, JP | March 31, 1993 | September 13, 1994 | |
| 5,287,421 | All-optical modulation in crystalline organic semiconductor waveguides | 5,287,421 | No | University of Southern California | Los Angeles, CA | Forrest; Stephen R.:Zang; De Yu | Princeton, NJ:Irvine, CA | January 11, 1993 | February 15, 1994 | |
| 5,118,945 | Photothermal test process, apparatus for performing the process and heat microscope | 5,118,945 | No | Siemens Aktiengesellschaft | Munich, DE | Winschuh; Erich:Petry; Harald | Neu-Insenburg, DE:Fechingen, DE | April 24, 1990 | June 2, 1992 | |
| 5,075,751 | Semiconductor device | 5,075,751 | Yes
| Matsushita Electric Works, Ltd. | Osaka, JP | Tomii; Kazushi:Abe; Toshiroh:Komoda; Takuya | Kadoma, JP:Kadoma, JP:Kadoma, JP | September 17, 1990 | December 24, 1991 | |
| 5,030,853 | High speed logic and memory family using ring segment buffer | 5,030,853 | No | Thunderbird Technologies, Inc. | Research Triangle Park, NC | Vinal; Albert W. | Cary, NC | March 21, 1990 | July 9, 1991 | |
| 4,628,203 | Non-delineated detector having a differential readout | 4,628,203 | No | Honeywell, Inc. | Minneapolis, MN | Reine; Marion B.:Kusner; Ronald R. | Wellesley, MA:Concord, MA | January 14, 1985 | December 9, 1986 | |
| 4,485,389 | Amorphous semiconductors equivalent to crystalline semiconductors | 4,485,389 | Yes
| Energy Conversion Devices, Inc. | Troy, MI | Ovshinsky; Stanford R.:Izu; Masatsugu | Bloomfield Hills, MI:Birmingham, MI | September 29, 1982 | November 27, 1984 | |
| 4,259,683 | High switching speed P-N junction devices with recombination means centrally located in high resistivity layer | 4,259,683 | Yes
| General Electric Company | Schenectady, NY | Adler; Michael S.:Temple; Victor A. K. | Schenectady, NY:Clifton Park, NY | August 21, 1978 | March 31, 1981 | |
| 4,217,374 | Amorphous semiconductors equivalent to crystalline semiconductors | 4,217,374 | No | Energy Conversion Devices, Inc. | Troy, MI | Ovshinsky; Stanford R.:Izu; Masatsugu | Bloomfield Hills, MI:Birmingham, MI | March 8, 1978 | August 12, 1980 | |
| 4,064,521 | Semiconductor device having a body of amorphous silicon | 4,064,521 | Yes
| RCA Corporation | New York, NY | Carlson; David Emil | Yardley, PA | July 30, 1976 | December 20, 1977 |